>> P.510
VisionMeasuringSystemsHigh-accuracy3DMeasuringSystemQVWLIcanmeasurecoordinatesanddimensionsandassessmicro-3Dformswithoutcontactinasinglemachine.3DdatacapturedbytheWLIopticalsystemenables3Dsurfacetextureanalysisand3Droughnessanalysis.Large-sizedCNCVisionMeasuringSystemThemovingbridgedesignmakesitsuitableformeasuringlargeobjectsaswellassmall,thinobjects.Thefixedstagedesignallowsforamoresimplifieddesignoftheworkpiecefixture.Non-contact3DMeasuringSystemQVWLIProLarge-sizedVisionMeasuringSystemQVACCELAhigh-accuracy3DmeasuringsystemwithaWLIopticalsystemthatcanmeasuremicro-formstothesub-micrometerlevel.Avisionmeasuringsystemwithamoving-bridgestructuresuitableformeasurementsofalargeworkpiece.EUX/EUY,MPE:0.8+2L/1000µm(L:Measuringlengthinmm)1X/E1Y:1.5+3L/1000µmE(L:Measuringlengthinmm)ProductcatalogE14001ProductcatalogE14028Micro-formMeasuringSystemTheversatile,high-accuracymicro-formmeasuringsystemcanmeasureawiderangeofworkpieces,frommicro-formstolargerpieces.VisionMeasuringSystemsCNCVisionMeasuringMachinewithMicro-formScanningProbeMicro-formMeasuringSystemMiSCANVisionSystemUMAPVisionSystemTYPE2Acomplexmeasuringsystemdesignedforscanningmeasurementswithastylusballdiameterassmallas125μm.Designedformicro-dimensionandformmeasurementswithastylusballdiameterassmallas15μm.1X/E1Y,MPE:1.5+3L/1000µm1X/E1Y,MPE:0.8+2L/1000µm(forMVSHypermodel)0,MPE:1.9+4L/1000µm(whenusingMPP-NANOprobesystem)0,MPE:1.9+4L/1000µm*(whenusingSP25Mprobesystem)EEEE(L:Measuringlengthinmm)EUX/EUY,MPE:0.8+2L/1000µm(forUVSHypermodel)EUX/EUY,MPE:0.35+1.3L/1000µm(forUVSULTRAmodel)E(L:Measuringlengthinmm)1X/E1Y,MPE:1.5+3L/1000µm*(whenusingUMAPprobesystem)ProductcatalogE14024Video12-11*Specificationsvarybyconfiguration,sizeandthermalenvironment.ProductcatalogE14000
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